JAPANESE JOURNAL OF APPLIED PHYSICS
ALESSANDRI C, ASSELBERGHS I, BREMS S, HUYGHEBAERT C, VAN CAMPENHOUT J, VAN THOURHOUT D, PANTOUVAKI M
APPLIED OPTICS
ALESSANDRI C, ASSELBERGHS I, BREMS S, HUYGHEBAERT C, VAN CAMPENHOUT J, VAN THOURHOUT D, PANTOUVAKI M
THIN SOLID FILMS
TREPALIN V, ASSELBERGHS I, BREMS S, HUYGHEBAERT C, RADU I, AFANAS EV V, HOUSSA M, STESMANS A
ADVANCED MATERIALS INTERFACES
WU XY, CHUANG YT, CONTINO A, SOREE B, BREMS S, TOKEI Z, HEYNS M, HUYGHEBAERT C, ASSELBERGHS I
IEEE ELECTRON DEVICE LETTERS
CONTINO A, CIOFI I, WU XY, ASSELBERGHS I, CELANO U, WILSON CJ, TOKEI Z, GROESENEKEN G, SOREE B
NANOTECHNOLOGY
NOURBAKHSH A, AGARWAL TK, KLEKACHEV A, ASSELBERGHS I, CANTORO M, HUYGHEBAERT C, HEYNS M, VERHELST M, THEAN A, DE GENDT S
APPLIED PHYSICS LETTERS
KLEKACHEV AV, KUZNETSOV SN, ASSELBERGHS I, CANTORO M, MUN JH, CHO BJ, STESMANS AL, HEYNS MM, DE GENDT S
NANOSCALE
LI B, KLEKACHEV AV, CANTORO M, HUYGHEBAERT C, STESMANS A, ASSELBERGHS I, DE GENDT S, DE FEYTER S
MICROELECTRONIC ENGINEERING
POLITOU M, WU XY, ASSELBERGHS I, CONTINO A, SOREE B, RADU I, HUYGHEBAERT C, TOKEI Z, DE GENDT S, HEYNS M
MICROELECTRONIC ENGINEERING
WU XY, ASSELBERGHS I, POLITOU M, CONTINO A, RADU I, HUYGHEBAERT C, TOKEI Z, SOREE B, DE GENDT S, DE FEYTER S, HEYNS M