国家/地区 | Usa(5) |
关键词 |
GRAPHENE(4)
CONTACT RESISTANCE(2)
FIELDEFFECT TRANSIS.(2)
|
出版物 | IEEE ELECTRON DEVICE LETTERS(5) |
出版时间 | 2011(2) 2013(2) |
机构 | IBM TJ WATSO.(3) IBM CORP(2) |
作者 | HAN SJ(5) |
IEEE ELECTRON DEVICE LETTERS
HAN SJ, OIDA S, JENKINS KA, LU D, ZHU Y
IEEE ELECTRON DEVICE LETTERS
FRANKLIN AD, OIDA S, FARMER DB, SMITH JT, HAN SJ, BRESLIN CM, GIGNAC L
IEEE ELECTRON DEVICE LETTERS
FRANKLIN AD, HAN SJ, BOL AA, PEREBEINOS V
IEEE ELECTRON DEVICE LETTERS
FRANKLIN AD, HAN SJ, BOL AA, HAENSCH W
IEEE ELECTRON DEVICE LETTERS
HAN SJ, CHEN ZH, BOL AA, SUN YN