国家/地区 美国（7） 世界知识产权组织（7） 中国（4） 韩国（4） 日本（2）
IPC部 B（7） C（7） G（2）
H（2）
IPC大类 B82（7） C01（7） B01（4）
B05（3） B32（2） C23（2）
G01（2） H01（2）
IPC小类 C01B（7） B82Y（6） B05D（3）
B01D（2） B01J（2） B32B（2）
B82B（2） C23C（2） G01N（2）
H01L（2）
IPC C01B031/04（7） B82Y030/00（4） B82Y040/00（4）
C01B031/02（4） B01D053/22（2） B01D067/00（2）
B01D071/02（2） B32B005/00（2） B82B003/00（2）
B82Y099/00（2）
发明人 MILLER S A（7）
公开年 2013（7）
申请年 2012（6） 
专利权人 EMPIRE TECHN.（7） ISLAND GIANT.（4）

System, useful for producing graphene, comprises first container including first solution, second container including second solution, and a chamber that is configured to receive first and second solutions from first and second containers.

MILLER S A

Encapsulating a substance with graphene involves combining graphene oxide and water to form aqueous solution; contacting reducing agent and substance; mixing aqueous solution with reducing agent and substance; and producing graphene.

MILLER S A

Membrane used to separate compound from fluid mixture, comprises graphene monolayer including discrete pores that are chemically perforated, where each pore has uniform pore size with carbon vacancy defects in the monolayer.

DUERKSEN G L, MILLER S A

Membrane used to separate gas from fluid mixture including first gas e.g. neon and second gas, includes graphene layer perforated by nanoscale pores, and gas sorbent to contact surface of layer and direct gas adsorbed at sorbent into pores.

DUERKSEN G L, MILLER S A

Partially altering defect area in a layer on substrate involves reacting substrate under reaction conditions to produce cationic area in exposed areas; adhering graphene oxide to cationic area to produce graphene oxide layer; and reducing.

MILLER S, YAGER T, MILLER S A, YAGER T A

Partially altering defect area in layer on substrate, comprises receiving the layer including graphene and some defect areas in graphene, and exposing the layer to gas including hydrogen, boron, aluminum, gallium, indium and/or thallium.

MILLER S, MILLER S A

Detecting defect in graphene sample involves exposing sample having graphene and some defects, to gas under specific condition, removing gas, placing obtained marked sample in detector system, and detecting marks bonded to defects in sample.

MILLER S A, MILLER S