国家/地区 | Usa(5) |
关键词 | EPITAXIAL GRAPHENE(8) |
出版物 | CARBON(2) |
出版时间 | 2018(3) 2021(2) |
机构 | NIST(3) NATL INST ST.(2) |
作者 | ELMQUIST RE(8) |
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
PAYAGALA SU, RIGOSI AF, PANNA AR, POLLAROLO A, KRUSKOPF M, SCHLAMMINGER S, JARRETT DG, BROWN R, ELMQUIST RE, BROWN D, NEWELL DB
MATERIALS
CHUANG CS, LIU CW, YANG YF, SYONG WR, LIANG CT, ELMQUIST RE
METROLOGIA
KRUSKOPF M, ELMQUIST RE
MICROELECTRONIC ENGINEERING
RIGOSI AF, LIU CI, WU BY, LEE HY, KRUSKOPF M, YANG YF, HILL HM, HU JN, BITTLE EG, OBRZUT J, WALKER ARH, ELMQUIST RE, NEWELL DB
2D MATERIALS
RIGOSI AF, HILL HM, GLAVIN NR, POOKPANRATANA SJ, YANG YF, BOOSALIS AG, HU JN, RICE A, ALLERMAN AA, NGUYEN NV, HACKER CA, ELMQUIST RE, WALKER ARH, NEWELL DB
CARBON
YANG YF, CHENG GJ, MENDE P, CALIZO IG, FEENSTRA RM, CHUANG C, LIU CW, LIU CI, JONES GR, WALKER ARH, ELMQUIST RE
IEEE TRANSACTIONS ON ELECTRON DEVICES
KRUSKOPF M, BAUER S, PIMSUT Y, CHATTERJEE A, PATEL DK, RIGOSI AF, ELMQUIST RE, PIERZ K, PESEL E, GOTZ M, SCHURR J
CARBON
RATHORE S, PATEL DK, THAKUR MK, HAIDER G, KALBAC M, KRUSKOPF M, LIU CE, RIGOSI AF, ELMQUIST RE, LIANG CT, HONG PD