国家/地区 中国（5）
IPC部 H（3） C（2）
IPC大类 H01（3）
IPC小类 H01L（3）
IPC
发明人 ZHOU P（5）
公开年 2011（3） 2012（2）
申请年 2011（5）
专利权人 UNIV FUDAN（5）

Method for measuring thickness and band structure of graphene film, involves establishing proper theory model according to structure of film and fitting analyzed elliptical data to aluminum foil stock to establish theory model base.

SHEN Y, SUN Q, WANG P, ZHANG W, ZHOU P

Electric-induction reduction of graphene oxide in manufacture of integrated circuit, involves forming graphene layer on substrate, oxidizing graphene layer to form graphene oxide, and reducing graphene oxide using electric contact probe.

SUN Q, WEI H, ZHANG W, ZHOU P

Gate oxide medium forming method for graphene FET in graphene apparatus, involves forming metal contact graphene layer, depositing atom layer to grow boron nitride as gate oxide medium, and arranging gate electrode on gate oxide medium.

SUN Q, WANG P, WU D, ZHANG W, ZHOU P

Method for preparing graphene FET, involves generating photoconduction effect in radiation of infrared ray by graphene channel layer.

ZHOU P, ZHANG W, WU D, SUN Q

Graphene FET for use in infrared detector for sky survey infrared detection application, has graphene channel layer generating photoconductive effect under infrared radiation and provided with multiple layers of graphite.

ZHOU P, ZHANG W, WU D, SUN Q